tools/testing/nvdimm: Use per-DIMM device handle

KASAN reports a global-out-of-bounds access when running these nfit
tests: clear.sh, pmem-errors.sh, pfn-meta-errors.sh, btt-errors.sh,
daxdev-errors.sh, and inject-error.sh.

[] BUG: KASAN: global-out-of-bounds in nfit_test_ctl+0x769f/0x7840 [nfit_test]
[] Read of size 4 at addr ffffffffc03ea01c by task ndctl/1215
[] The buggy address belongs to the variable:
[] handle+0x1c/0x1df4 [nfit_test]

nfit_test_search_spa() uses handle[nvdimm->id] to retrieve a device
handle and triggers a KASAN error when it reads past the end of the
handle array. It should not be indexing the handle array at all.

The correct device handle is stored in per-DIMM test data. Each DIMM
has a struct nfit_mem that embeds a struct acpi_nfit_memdev that
describes the NFIT device handle. Use that device handle here.

Fixes: 10246dc84dfc ("acpi nfit: nfit_test supports translate SPA")
Cc: stable@vger.kernel.org
Signed-off-by: Alison Schofield <alison.schofield@intel.com>
Reviewed-by: Dave Jiang <dave.jiang@intel.com>> ---
Link: https://patch.msgid.link/20251031234227.1303113-1-alison.schofield@intel.com
Signed-off-by: Ira Weiny <ira.weiny@intel.com>

0 files changed, 0 insertions, 0 deletions